We offer stage micrometers and calibration targets for routine calibration of imaging systems. These test targets allow users to determine the resolution, distortion, magnification, or spatial frequency response of an imaging system. Reticles can be used to superimpose a crosshair or concentric circle pattern on an imaged object. Obstruction targets can be used to filter out lower order modes. Fluorescent slides and disks are available for calibrating and aligning fluorescence imaging systems. We also offer flexible options for custom patterned optics with features down to 1µm; contact us at TSW@thorlabs.com to discuss your custom target or reticle.
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