Educational Atomic Force Microscope (AFM)

Educational Atomic Force Microscope

• Designed for Education, Demonstration, and Classroom Use
• Complete Photonics Kit Includes All Hardware Except Breadboard Plus Extensive Manual and Teaching Materials
• Easy to Assemble and Use
• Choose from Educational Kits Containing Imperial or Metric Components

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The laser beam collimation in the EDU-AFM1(/M) Education Kit is being adjusted.

Thorlabs Educational Products

Thorlabs' line of educational products aims to promote physics, optics, and photonics by covering many classic experiments, as well as emerging fields of research. Each educational kit includes all the necessary components and a manual that contains both detailed setup instructions and extensive teaching materials. These lab kits are being offered at the price of the included components, with the educational materials offered for free. Technical support from our educational team is available both before and after purchase.

Purchasing Note: English and German language manuals/teaching information are available for this product. The imperial kit contains the English manual and US-style power cord. The appropriate manual and power cord will be included in the metric kit based on your shipping location. The power supplies and other electronic devices in both the metric and the imperial kit accept voltages of 230 VAC and 120 VAC. Some power supplies include a switch for selecting the mains voltage. See the respective manuals for details. Please contact Tech Support if you need a different language, cord style, or power supply. As with all products on our website, taxes are not included in the price shown below.

Laser Safety

Thorlabs' Atomic Force Microscope Educational Kit uses a 635 nm, 2.5 mW Class 3R laser, which necessitates that all users be trained and follow all necessary safety protocols. This includes wearing laser safety glasses.

We would recommend discussing your needs with your organization's laser safety officer. More details about the laser classification system and Thorlabs laser safety products can be found on the Laser Safety tab.

A Schematic of the EDU-AFM1(/M) Educational Atomic Force Microscope. The red lines represent the path of the laser light and the blue lines represent electrical connections.

Thorlabs demonstration/educational atomic force microscope (AFM) kit is designed for classroom, lab, and other educational uses. It features an AFM probe, a sample holder on a motorized stage with motorized closed-loop positioning control, a laser and four-segment photodiode detector for measuring the probe deflection, and the intuitive EDU-AFM software package to control the setup.

Operation
AFM measurements use a probe, comprised of a flexible cantilever that supports a nanometer-scale tip, to scan the surface structure of samples. The schematic to the right illustrates how the EDU-AFM1(/M) Educational AFM operates. Laser light is provided by a 635 nm fiber-coupled benchtop source. A patch cable feeds the laser light into a collimator consisting of a lens in an adjustable zoom housing. This collimator is mounted on a 3-axis kinematic mount so that the focused laser spot can be centered on the cantilever surface. Light reflected from the cantilever enters the detector mount assembly, where it is again focused onto the surface of a four-segment photodiode. The voltage measurement from the photodiode provides a measurement of the cantilever deflection that can either be used directly to create an image or in a feedback loop to control the height of the sample stage.

Sample Stage and Cantilever
In the EDU-AFM1(/M), the probe remains stationary while a sample is moved underneath the probe tip using a MAX311D(/M) 3-Axis Stage with Closed-Loop Piezos. The probe is held in a custom mount secured to an AMA009(/M) Platform that connects to the stationary side of the MAX311D(/M), as shown in the image below. KPZ101^a K-Cube Piezo Controllers are used to drive each axis of the sample stage. The piezo controllers for the X and Y axes are each paired with a KSG101^a Strain Gauge Reader, which measures the piezo deflection. Together, these K-cubes provide closed-loop control to accurately set and maintain the stage position in X and Y. The KPZ101 used for Z-axis control is connected to a KPA101 K-Cube Position Sensing Detector Auto Aligner with an internal digital signal processor (DSP) that is used to monitor the cantilever deflection, as explained below.

1. This previous-generation item is not available for individual purchase. Please contact Tech Support if a replacement is needed.

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Laser Collimation (Top Right), Cantilever (Center), and Detector Mount (Top Left) Assemblies

Image Acquisition and Measurement Modes
Before beginning a scan, the system is set up so that the light reflected from the cantilever is incident on the center of the four-segment photodiode detector. As the sample is scanned, the cantilever will begin to deflect, moving the spot away from the center of the detector and changing the output voltage signals. Depending on the scanning mode, this output voltage signal is used in different ways. In Constant Height Mode, the voltage signal is used directly as height information. The EDU-AFM software pairs each voltage measurement with the XY position on the sample to create a contour map of the surface.

Ideas for Modifying the Kit?

We strongly encourage users to make their own modifications to our kits to enhance or expand the kits' capabilities, including adding or altering components. If you would like to share your modifications with the community, let us know and we will add your ideas with a reference to the kit webpage.

In Constant Force Mode, the system is set up to keep the cantilever deflection constant: this is accomplished by setting up a closed feedback loop between the photodiode, the DSP in the auto aligner, and the Z-axis piezo controller. When the four segment photodiode detects a change in the laser spot position, the DSP in the auto aligner calculates the adjustment to the sample height needed to maintain the initial cantilever deflection. This signal is used by the EDU-AFM software as height information, combined with the data from the X- and Y-axis piezo controllers, to create a contour map of the sample surface.

In addition to these two scanning modes, the EDU-AFM1(/M) can also measure the lateral forces on the cantilever and the way forces on the cantilever change as the sample surface is approached. For more information on AFM scanning modes, see the AFM Basics tab.

Laser Safety Information
The class 3R laser used in this kit emits in excess of 2.5 mW of optical power, which can cause damage to the eyes if viewed directly. We recommend wearing appropriate laser safety glasses when using this kit. See the Laser Safety tab for details.

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This image was taken with the digital microscope included in the AFM kit and shows the laser focused on the cantilever.

What is Atomic Force Microscopy?

Atomic force microscopy, a form of scanning probe microscopy, offers fascinating insights into structures beyond the resolution limits of optical microscopy and therefore into the world of nanostructures. The scanning method is based on a fine scanning probe, which consists of a flexible arm called a cantilever that supports a tip radius less than 10 nm. As the tip interacts with the surface of a sample, the deflection of the cantilever is recorded in order to create an elevation profile of the surface line by line. For an atomic force microscope (AFM) to function properly, the cantilever must meet several requirements. A low spring constant is needed so that small forces can be measured. It must have a large resonance frequency to minimize the influence of mechanical oscillations. Therefore, the cantilever must both have low mass and a small size.

In the EDU-AFM1(/M), the light from a laser source is focused onto the cantilever by a focusing lens in an adjustable zoom housing. The light reflected from the cantilever strikes a position-sensing detector (four-segment photodiode). When the cantilever is deflected during scanning due to a change in the surface height, the corresponding deflection of the laser beam is measured, and then read and processed by the digital signal processor (DSP). Depending on the scanning mode used (detailed below), the deflection-dependent voltages from the four-segment photodiode can be used as height information to create a contour map of the sample surface or as a feedback signal between the DSP and a z-axis positioning unit supporting the sample. In the latter case, the Z-axis positioning unit can be used to adjust the height of the sample to maintain a constant cantilever deflection (as measured by the four segment photodiode), and a contour map the sample surface is created by recording the changes in the stage height.

Measurement Modes

All AFM scanning modes are based on the interaction between the probe tip and the sample, but different aspects of this interaction can be probed when examining a sample. In general, AFM modes can be divided into two categories. In contact scanning modes, the cantilever tip is dragged across the surface of the sample and the effects on the deflection of the cantilever are measured. In dynamic scanning modes, the tip of the cantilever is forced to oscillate and the effects of this oscillation are measured. The EDU-AFM1(/M) is only capable scanning in a contact mode, so we will focus on the two types of contact modes here: constant height mode and constant force mode.

Figure 2: In Constant Force Mode, the cantilever deflection remains constant and the movement of the probe holder (or sample) needed to maintain that deflection is measured.

Figure 1: In Constant Height Mode, the sample height remains constant and the cantilever deflection is measured.

Constant Height
Constant height mode is the simplest scanning method since it only requires the measurement of the cantilever deflection. The sample and cantilever are held at a constant distance from each other and the probe tip is scanned over the surface of the sample, as illustrated in Figure 1. The deflection of the cantilever is measured, and this is used to create a contour map of the sample surface. The downside is that this method only works for relatively flat samples, as the motion of the cantilever is limited by the size of the cantilever and its flexibility. Deep structures can result in a loss of contact with the sample or cause damage to or deformation of the cantilever or sample.

Constant Force
Constant force mode, illustrated in Figure 2, uses a feedback mechanism to adjust either the probe or sample height in order to maintain a constant cantilever deflection. In the case of the EDU-AFM1(/M), the deflection of the cantilever is measured by the four-segment photodiode, and a DSP uses resulting feedback to calculate the Z-piezo voltage needed to keep the deflection constant. This Z-piezo control voltage is recorded and used to create a contour map of the sample surface. This scanning method can probe deeper surface structures than constant height mode without a loss of contact or damage to the cantilever or sample, as the force acting on the cantilever is constant.

Figure 3: In lateral force mode, the torsion of the cantilever is measured instead of the deflection. The tip torsion will behave differently than the deflection for changes in sample surface height and changes in the sample surface material.

Lateral Force Measurement (LFM)
When performing scans in constant force or constant height mode, additional information can be gathered from the torsion of the cantilever. This most commonly occurs at steep edges in the sample, or due to changes in friction at the sample surface caused by a change in the material. This deflection caused by torsion of the tip will be perpendicular to the deflection caused by changes in sample feature height, allowing the two signals to be separated. Figure 3 provides a comparison between the different profiles that result when a lateral force measurement is taken.

Force-Distance Curves
In addition to topography measurements, atomic force microscopes can also record force-distance curves, which serve as an important tool in many sciences including biochemistry and biology. These curves measure the change in force as the probe tip approaches the sample surface, which can be used to determine physical characteristics such as the modulus of elasticity. When conducting a force-distance measurement, the sample is moved towards the probe tip before being retracted. This causes the cantilever to deflect in response to the forces near the sample surface as illustrated in Figure 4, and this deflection is recorded as a function of the distance between the probe and the sample.

As the sample is moved towards the probe, there will be a point where attractive forces cause the tip to engage with the sample (Snap-In). The sample continues to move towards the probe until the cantilever straightens, and is then deflected upward. Then, the sample is moved downwards again. The probe tip will remain engaged with the sample surface until the restoring spring force of the cantilever is greater than the adhesive forces between the tip and the sample, at which point the cantilever will return to its rest position (Pull-Off). Note that the height of the sample at Snap-In and Pull-Off are not the same.

Figure 4: This schematic illustrates how the cantilever deformation changes during a Force-Distance Measurement. The red arrows indicate the motion of the sample relative to the probe holder, while the blue arrows indicate the motion of the cantilever. The green arrows indicate the difference in sample height between when the cantilever first engages with the sample (Snap-In) and when the cantilever disengages with the sample (Pull-Off).

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Screenshot of the Gwyddion Software During the XY Calibration Procedure

After students construct the educational AFM, they can complete a series of exercises outlined in the manual to practice different scanning methods and familiarize themselves with post-processing techniques in Gwyddion (see the Software tab). This tab includes a brief summary of the experiments included with the EDU-AFM1(/M) kit, with exercise numbers that match the manual.

Lateral Calibration using the Included Microstructure

The AFM can be calibrated using the included microstructure to enhance the measurement accuracy. Through this set of exercises, students learn how to check or redo the calibration. Lateral calibration allows for the instrument to accurately record the location of each data point in X and Y. The microstructure sample is designed specifically for this purpose with 100 nm tall features that are arranged with a pitch that varies between 5 µm and 10 µm.

Exercise 1.1: Measure the circle structure of the microstructure sample in a 20 µm x 20 µm scanning window in constant force mode with the default calibration settings. Measure the same image with strain gauge feedback enabled and disabled.

Exercise 1.2: Use the Gwyddion software to determine the structure pitch in the X and Y directions, and calculate the feature size compared to the datasheet information in %.

Exercise 1.3: Enter the calibration data from Exercise 1.2 into the EDU-AFM software, and record the same image again to check the calibration results.

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This image of a CD was taken with the EDU-AFM1. The pit length (red line), pit width (blue line), and track width (green line) are marked.

Topography of CD, DVD, and Blu-Ray Discs

This kit includes CD, DVD, and Blu-Ray disc samples that were taken out of the production process prior to encapsulation. This means that the stamped surface is accessible and ready for a surface scan. Students can image each type of disc, measure the surface features, and compare the data densities of the different encoding methods

Exercise 2.1: Record an image of the CD surface in constant force mode.

Exercise 2.2: Record an image of the DVD in constant force mode.

Exercise 2.3: Record an image of the Blu-Ray disc in constant force mode.

Exercise 2.4: Determine the track width, track pitch, minimum and maximum pit length of the CD, DVD and Blu-Ray disc.

Exercise 2.5: Determine the pit depth using the profile function in Gwyddion. Compare the pit depths of the CD, DVD and Blu-ray samples and explain why they are different.

Exercise 2.6: Calculate the maximum storage capacity of a CD.

Lateral Force Measurement

Students practice taking lateral force measurements with the AFM using the included microstructure sample and a human hair.

Exercise 3.1: Scan the microstructure sample in constant height mode, recording a lateral force image in a 20 µm x 20 µm scan area. Interpret the profile information.

Exercise 3.2.1: Record the topography of a human hair. Scan the hair in constant force mode.

Exercise 3.2.2: Record a lateral force image of a hair in constant height mode.

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A screenshot from the EDU-AFM software showing a force-distance measurement. The key features of the curve have been labeled.

Force-Distance Measurement

This series of exercises familiarizes students with force-distance measurements. These measurements can be used to determine the adhesion force between the tip and the sample surface, as well as the modulus of elasticity. The cantilever spring constant can also be calculated.

Exercise 4.1: Record a force-distance curve (without zoom) of the microstructure sample and determine the rest position, snap-in, and pull-off. What effects are observable?

Exercise 5.1: Determine the spring constant of the cantilever.

Exercise 6.1: Measure the force-distance curve of various samples (for example: stainless steel, plastic or rubber). Label the most interesting points of a force-distance curve.

Exercise 6.2: Determine the maximum adhesion force.

Exercise 7.1: Compare the deflection of the cantilever with a hard (non-deformable) sample to the sample for which you want to estimate the modulus of elasticity.

Exercise 7.2: From Exercise 7.1, determine the depth of the cantilever deflection compared to the reference sample and use this to estimate Young's modulus of elasticity.

Atomic Force Microscope Kit Components

The EDU-AFM1(/M) must be mounted on an optical table or breadboard. As these are common in many labs, we have not included a breadboard in this kit. If you need to purchase a breadboard separately, we recommend the B1824F Nexus^® Honeycomb Breadboard with the AV5 Damping Feet for the imperial kits (B4560A with AV5/M, respectively, for metric kits), which are available separately below.

Thorlabs' Atomic Force Microscope Kits are available in imperial and metric versions. In cases where the metric and imperial kits contain parts with different item numbers, metric part numbers and measurements are indicated by parentheses unless otherwise noted.

• This is a class 3R laser and necessitates that all users be trained and follow all necessary safety protocols, including wearing laser safety googles.
• A total of 2 SM1L05 lens tubes are included with this kit, in the laser collimation and detector mounting assemblies.
• This previous-generation item is not available for individual purchase. Please contact Tech Support if a replacement is needed.
• A location-specific adapter ships with the power supply based on your location.
• This kit contains the number of screws indicated in the Qty. column; replacements, which are sold in packages of 25, are available by ordering the Item # listed.
• This kit contains the number of washers indicated in the Qty. column; replacements, which are sold in packages of 100, are available by ordering the Item # listed.
• This kit contains the number of screws indicated in the Qty. column; replacements, which are sold in packages of 50, are available by ordering the Item # listed.

Software

Each kit includes a USB stick with the free EDU-AFM software package, used to control the AFM and record measurements. The software features a graphical representation of the Four Segment Photodetector, as well as separate tabs for each measuring mode. Measurements can be saved as an image or in data format. If the original USB stick is lost, please contact Tech Support for another copy of the software. Future software updates will be made available for free, and can be accessed through the EDU-AFM's Software Update function.

Gwyddion
The kit also makes use of Gwyddion, a popular image processing program for AFM measurements. A tutorial for importing data in Gwyddion and image post processing tips are provided in the EDU-AFM1(/M) manual. The package can be downloaded here.

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A graphical representation of the four segment photodiode in the EDU-AFM software. The voltage produced by the four-segment photodiode by the laser total intensity (SUM) and the laser position (XDIFF/YDIFF) appear in the upper right hand corner of the graph. The XY position of the stage, as well as the feedback from the strain gauge and z-axis controller, appear in the side bar.

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An example measurement of the microstructure sample in Constant Force Mode.

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An example of a force-distance curve. The stage moves upwards by 4 µm (15 V), and the cantilever deflection as it interacts with the sample is measured. This data can be used to calculate the adhesion forces and Young's modulus of the material.

Drawings and 3D Modelsa
Document Description	EDU-AFM1	EDU-AFM1/M
Auto CAD PDF
Auto CAD DXF
Solidworks
eDrawing
Step

• The breadboard shown in these models is not included with the kit.

Kit Assembly

The video to the right shows the steps for assembling the EDU-AFM1(/M) kit. The video speed can be adjusted by clicking on the gear icon in the lower right-hand corner of the player.

A mechanical drawing and 3D models of the setup in the video are provided through the links to the right. Please note that while the drawings and solid models show a breadboard, one is not included in the kit as breadboards and optical tables are a staple in many labs. A B1824F Nexus^® Honeycomb Breadboard for the imperial kit or B4560A Nexus^® Honeycomb Breadboard for the metric kit can be purchased separately below; a standard aluminum breadboard should not be used with the kit as it will not sufficiently isolate the AFM from vibrations.

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2D Image Taken with EDU-AFM Software

Tip Engagement of the AFM Kit

The video to the right shows how a sample can be manually adjusted to engage the tip of the AFM probe.* Differential screws with both coarse and fine adjustment are used in combination with a height feedback sensor for gentle contact that does not damage the tip of the probe. The camera has high magnification so that the sub-millimeter thick tip can be seen in the software during its approach to the sample. Once the sample is engaged with the tip, the video shows the AFM kit scanning in constant force mode. Note that the USB camera is capable of showing the scanning movement of the cantilever. An example image is shown to the right. For more example images, please see the Image Gallery tab. 

*Please note that the video shows a previous version of Thorlabs' EDU-AFM1(/M) software GUI. However, the functionality remains the same. 

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This image was taken with the digital microscope included in the AFM kit and shows the laser focused on the cantilever.

Changing the AFM Probe

Over time, the tip of the AFM probe will wear, eventually leading to a tip diameter that is larger than the expected features or image artifacts. When this happens, the probe should be changed, as demonstrated in the video to the right.

The EDU-AFM1(/M) kit includes 10 BudgetSensors ContactAl-G* probes. The cantilevers on these probes have an enhanced reflectivity due to their aluminum coating, leading to less light from stray reflections off of the sample surface. Standard cantilever tips can also be used.

*BudgetSensors cantilevers can be found here.

Customization Possibilities

The open and modular nature of Thorlabs' Educational Atomic Force Microscope kit lends itself to user modifications, making it an excellent platform for prototyping novel research applications. Below are two examples of what can be done. 

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Figure 1: An AFM Tip Holder Modified to Hold a Glass Slide

Modifying the EDU-AFM1(/M) for Use in Liquids

The kit only requires minimal modifications to enable measurements in liquids, which is beneficial for biological applications where drying the sample may destroy it.

To this end, the tip holder that is included with the kit was modified by adding a groove and an M3-tapped through hole. The groove allows the insertion of a
1 cm x 1 cm glass slide (0.6 mm thickness), and the tapped hole enables an M3 setscrew to secure the glass slide, as shown in Figure 1*. The setup utilizes the liquid's surface tension on the glass slide to produce a stable interface through which the laser passes.

*Please note that the tip holder is not typically anodized. 

Figure 2c: Immersed Sample Being Scanned as the Laser Reflects from the Cantilever after Passing through the Glass Slide and Liquid

Figure 2b: Modified Holder Producing a Stable Liquid-Glass Interface While Approaching the Immersed Sample

Figure 2a: Sample Immersed in Liquid Prior to Approach

A drop of liquid is added on top of the included calibration sample, as shown in Figure 2a. When approaching such a sample, the glass slide creates two stable and planar interfaces, from air-glass then glass-liquid (see Figure 2b), that do not change while the sample is scanned. One can even see the path of the laser through the liquid in Figure 2c. After realignment of the laser spot to the cantilever, measurements can be performed identically to the dry case.

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Figure 4: A second, weaker spot is generated by reflection on the top surface of the glass slide (right spot). This does not negatively impact the measurements.

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Click Here for Raw Data of a Typical Lineout
Figure 3b: Test Sample in Water

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Click Here for Raw Data of a Typical Lineout
Figure 3a: Test Sample in Air

The calibration sample was scanned in air and in water to compare the performance, as depicted in Figure 3a and Figure 3b, respectively. As mentioned above, the performance is shown to have negligible differences in air and in water. A data file is provided for a typical lineout on the sample for both the water and air cases.  

Please note that a second spot is generated due to the reflection of the laser on the glass slide, as shown in Figure 4. This second spot will reach the detector but it is weaker than the primary spot. Furthermore, it does not move when the sample is scanned and therefore does not affect the measurements.

Customization with Different Hardware and Software Configurations

As the K-Cube Controllers in the EDU-AFM1(/M) kit can be controlled by any software written in .NET-compatible languages (e.g., C# or LabVIEW), as well as using its own analogue interface, they can easily be adapted to different hardware and software configurations.

As an example, Petr Klapetek and colleagues from the Czech Metrology Institute and Polish Central Office of Measures used a self-developed AFM controller called Gwyscope (based on a Red Pitaya FPGA board), shown in Figure 5, and a self-written software. These changes improved the scanning speed of the kit and enabled advanced scan paths, such as spiral or interleaved scans, by directly reading the output of the strain gauge controllers. This required the addition of a third KSG101* controller for the Z-axis. Figure 6 shows the complete setup and Figure 7 shows a spiral scan taken on the test sample included with the kit. A spiral scan path minimizes stage acceleration during scanning, which is beneficial for high-speed AFM systems. Using the easily accessible interfaces of the controllers used in the EDU-AFM1 kit, various concepts of high-speed scanning and non-raster data acquisition, developed in the MetExSPM EMPIR project, were successfully tested.

*The KSG101 is no longer available for individual purchase and has been replaced by KPC101. Please contact Tech Support if you are interested in this application.

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Figure 7: A spiral scan was taken with the Gwyscope controller and EDU-AFM1 kit using the test sample included with the kit. The red areas outside of the circle are not part of the scan.

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Figure 6: EDU-AFM1 Kit Connected to the Gwyscope Controller and Laptop with Custom Software

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Figure 5: Gwyscope Controller

Educational Atomic Force Microscope Image Gallery

The images below were all taken using Thorlabs' Educational Atomic Force Microscope (AFM). Of the samples shown below, the microstructure sample and blu-ray disc are included with the kit. If you would like to share your own AFM images, you can submit them to techsupport@thorlabs.com and we'll consider them for addition to the image gallery.

BudgetSensors HS100-MG Microstructure (Included with Kit)

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2D Image Taken with EDU-AFM Software

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3D View Generated by Post Processing in Gwyddion

Image of the BudgetSensors HS-100MG Microstructure included with the EDU-AFM1(/M) kit.
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 200 Pixels/s Scan Speed

Blu-Ray Disc (Included with Kit)

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

Image of the Blu-Ray Sample (Open Layer) included with the EDU-AFM1(/M) kit.
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, P = 0.8, I = 0.4, D = 0.2, 50 Pixels/s Scan Speed

AFM Stripe Artifacts

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2D Image of Microstructure

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2D Image of CD

These images show examples of stripe artifacts caused by dust pushed over the surface of the microstructure sample by the probe tip (left) and the soft sample surface of the stamped CD structure (right).
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 200 Pixels/s Scan Speed

Moth Eye Cones

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

Image of Moth Eye Cones
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

Dried Blood Cell

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion with Colorized Overlay

Image of a Dried Blood Cell
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

Human Hair

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

Image of a Human Hair
Acquisition Settings: Constant Force Mode, 100 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

Cobalt Nanoparticles

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

As an example, the Educational AFM Kit was used to image a PELCO^® AFM Tip and Resolution Test Specimen, which consists of a single layer of cobalt particles. The particles are flattened half-spheres with a radius typically larger than the height and particles heights varying between 1 and 5 nm. When imaged with the EDU-AFM1, the measured particle size was approximately 25 nm in diameter. The tip diameter is approximately 15 nm, which results in a resolved particle size of 10 nm. Further information can be found in the manual.
Acquisition Settings: Constant Force Mode, 100 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

User Images: Courtesy of Richard Becher (KIT)

These images, taken using the Educational AFM, were provided to Thorlabs by Richard Becher from the Karlsruhe Institute of Technology (KIT).

Gore-Tex^®

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2D Image Taken with EDU-AFM Software

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3D View Generated by Post Processing in Gwyddion

The pores in Gore-Tex^® material are smaller than 1 µm, making them too small for water drops to pass through. Vapor can pass through the other side of the fabric, making this material both breathable and waterproof.
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, P = 0.2, I = 0.2, D = 0.2, 200 Pixels/s Scan Speed

Structures to Enhance Solar Cell Light Absorption

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2D Image taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

The geometrical structure of rose petal skins enhances their light-absorbing capabilities. Scientists at KIT have applied materials molded to match this structure to the surface of solar cells, enhancing their light gathering capabilities. The images above are of one such structure. Sample courtesy of the Light Technology Institute at KIT Karlsruhe (www.lti.kit.edu).
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, P = 0.2, I = 0.2, D = 0.2, 100 Pixels/s Scan Speed

Synthetic Moth Eye Structures

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

Moth eyes are covered in an array of light sensitive cones that reduce reflections at the air-chitin border. Materials with an array of cones that are the same size as those in a real moth eye are used in technology to make surfaces antireflective. Sample courtesy of temicon^® (www.temicon.com).
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

Irridescent Butterfly Wing

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2D Image Taken with EDU-AFM1(/M)

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A Photograph Showing the Irridescence of the Butterfly Wing

The cascading nanostructures found on the wings of the Morpho Aega butterfly are responsible for its irridescent color. This sample is courtesy of Naturkundemuseum Karlsruhe (www.smnk.de).
Acquisition Settings: Constant Force Mode, 250 Sampled Pixels, Default PID Settings, 100 Pixels/s Scan Speed

Zinc-Nickel Deposition on Steel

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2D Image Taken with EDU-AFM1(/M)

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3D View Generated by Post Processing in Gwyddion

A steel panel was coated with a zinc-nickel (ZnNi) alloy for corrosion protection. The sample is courtesy of Integran Technologies (www.integran.com). The scan was taken at the University of Toronto Scarborough by Libertad Rojas in the group of Dan Weaver.
Acquisition Settings: Constant Force Mode, 250 x 250 Sampled Pixels, P = 1.2, I = 0.5, D = 0.2, 100 Pixels/s Scan Speed